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IAM NANO 2015

Invited Speakers

(alphabetic order, tentative titles, * = to be confirmed)

  • Sara Bals – University of Antwerp, Belgium High-resolution 3D imaging of nanomaterials
  • Uli Dahmen - NCEM Berkeley, USA Atomic mechanisms of interface motion by aberration-corrected TEM
  • Gerhard Dehm - MPI Eisenforschung, Düsseldorf, Germany Nano- and micromechanics of materials
  • Niels de Jonge – INM, Saarbrücken, Germany Liquid STEM – biological and functional materials systems
  • Rafal Dunin-Borkowski - ER-C Juelich, Germany Quantitative mapping of magnetic fields
  • Max. Haider – CEOS, Heidelberg, Germany Instrumentation for advanced and in-situ microscopy
  • Ferdinand Hofer - FELMI ZFE TU Graz, Austria STEM at atomic resolution
  • Martin Hÿtch – CEMES-CNRS, Toulouse, France Strain mapping in nanostructures by dark-field electron holography and aberration-corrected HR(S)TEM
  • Wolfgang Jäger - Materials Science, University of Kiel, Germany Advanced TEM in developing high-efficiency solar cells
  • Hiroshi Jinnai - Tohoku University, Sendai Japan Dynamical aspects and nano-fabrication of soft materials studied by electron microscopy
  • Jörg Jinschek - Materials Science, FEI Eindhoven, Netherlands In-situ TEM
  • Wayne Kaplan - Technion Institute of Technology, Haifa, Israel Structural and Chemical Adsorption Transitions at Metal-Ceramic Interfaces
  • Lorenz Kienle - Materials Science, CAU Kiel, Germany TEM on energy materials
  • Christoph Koch - University of Ulm, Germany In-line electron holography and large-area strain measurement
  • Ai Leen Koh - Stanford University, USA Electron energy loss spectroscopy (EELS) / ETEM in studying oxidation and hydrogenation phenomena
  • Christian Kübel –KIT, Karlsruhe, Germany In-situ TEM - mechanical and electrochemical testing
  • Joachim Mayer - RWTH Aachen, Germany Chromatic aberration corrected TEM and applications in materials science
  • Paul Midgley - University of Cambridge, UK New developments in electron crystallography - molecular motion and 3D orientation mapping
  • Andrew Minor - NCEM, Berkeley, USA In situ TEM nanomechanics with diffraction imaging
  • Eva Olsson - Chalmers University, Göteborg, Sweden In situ EM and soft matter
  • Velimir Radmilovic - University of Belgrade, Serbia Highly monodisperse core/shell precipitates in AlLiSc alloys
  • Martin Ritter - Hamburg University of Technology TUHH, Germany Preparation of nanoporous gold for EBSD analysis
  • Harald Rose - University of Ulm, Germany Holographic Imaging and Optical Sectioning in the Aberration-corrected STEM
  • Andreas Rosenauer - University of Bremen, Germany Quantitative STEM
  • Christina Scheu - MPI Eisenforschung Duesseldorf and RWTH Aachen, Germany Interfaces in nanostructured photovoltaic devices
  • Robert Sinclair – Stanford University, USA Aberration-corrected environmental TEM and nanoparticle research for medical applications
  • Manabu Shirai - Hitachi High-Technologies Corporation, Japan Development of a multiple gas injection system for in-situ observation in a cold FE TEM
  • Guillermo Solorzano - PUC-Rio, Rio de Janeiro, Brazil Phase transformations in metallic nanomaterials
  • Erdmann Spiecker - University of Erlangen, Germany Quantitative transmission electron microscopy of single-crystal superalloys
  • Lorenz Lechner Carl Zeiss X-Ray Microscopy, Inc., Germany Enabling New Opportunities for Correlative Workflows in Materials Science
  • Karsten Tillmann - ER-C Juelich, Germany Quantifying TEM contrast: Continuum mechanical modelling of strained nanostructures
  • Horst Weller - Institut für Physikalische Chemie, TUHH, Germany Structural and analytical TEM investigations for the development of nanocrystals in materials and life science applications
  • James Wittig - Vanderbilt University, Nashville USA Deformation Mechanisms in High-Mn Austenitic Steels using aberration corrected electron microscopy
  • Stefan Zaefferer - MPI Eisenforschung, Düsseldorf, Germany Electron backscatter diffraction (EBSD) techniques for characterization of deformation structures
  • Nestor Zaluzec - Argonne National Lab, USA Quantitative EDXS and applications in materials science